- Tytuł:
- The Impact of Noise and Mismatch on SAR ADCs and a Calibratable Capacitance Array Based Approach for High Resolutions
- Autorzy:
-
Mueller, J. H.
Strache, S.
Busch, L.
Wunderlich, R.
Heinen, S. - Tematy:
-
analog-digital conversion
analog-digital integrated circuits
calibration
CMOS integrated circuits
mathematical model
MATLAB
mixed analog digital integrated circuits
noise
numerical simulation
prediction methods - Pokaż więcej
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Powiązania:
- https://bibliotekanauki.pl/articles/226396.pdf Link otwiera się w nowym oknie
- Opis:
- This paper describes widely used capacitor structures for charge-redistribution (CR) successive approximation register (SAR) based analog-to-digital converters (ADCs) and analyzes their linearity limitations due to kT/C noise, mismatch and parasitics. Results of mathematical considerations and statistical simulations are presented which show that most widespread dimensioning rules are overcritical. For high-resolution CR SAR ADCs in current CMOS technologies, matching of the capacitors, influenced by local mismatch and parasitics, is a limiting factor. For high-resolution medium-speed CR SAR ADCs, a novel capacitance array based approach using in-field calibration is proposed. This architecture promises a high resolution with small unit capacitances and without expensive factory calibration as laser trimming.
- Dostawca treści:
- Biblioteka Nauki
Artykuł