Temat: 68.65.+g - Prolib Integro

Skocz do pozycji: 1.

Tytuł:: The Band Structure and Electron Density of InSb$\text{}_{1-x}$Bi$\text{}_{x}$ Solid Solutions
Autorzy:: Vyklyuk, J. I.
Deibuk, V. G.
Tematy:: 68.65.+g; Pokaż więcej
Data publikacji:: 1998-09
Powiązania:: https://bibliotekanauki.pl/articles/1992541.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1998, 94, 3; 611-616
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: A band structure of semiconductor InSb$\text{}_{1-x}$Bi$\text{}_{x}$ substitution solid solution is calculated by the empirical pseudopotential method. Spin-orbital interactions are also included in local calculations. Using the virtual-crystal approximation the composition and temperature dependences of energy gap are studied. The results are in good agreement with available experimental data.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 2.

Tytuł:: Investigations on ZnSe/GaAs Interface by Treatment of GaAs (2×4) Surface with Te and Mg
Autorzy:: Ebel, R.
Spahn, W.
Ress, H. R.
Albert, D.
Schäfer, H.
Ehinger, M.
Faschinger, W.
Landwehr, G.
Tematy:: 68.55.Bd
68.65.+g; Pokaż więcej
Data publikacji:: 1996-10
Powiązania:: https://bibliotekanauki.pl/articles/1950745.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1996, 90, 4; 767-772
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: The heterovalent interface ZnSe/GaAs, despite the small lattice misfit, still poses certain problems. The condition of the substrate surface prior to growth start determines the initial growth conditions, which on the other hand are assumed to be responsible for defect densities. Since Zn, in contrast to Se, hardly binds to GaAs the initial surface during growth start is essentially Se terminated. Therefore the binding of Mg to Se terminated GaAs was investigated. The structural quality of 140 nm thick ZnSe layers on different MgSe coverages were compared to conventionally grown and Te initiated ZnSe epilayers of the same thickness.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 3.

Tytuł:: Description and Interpretation of Systematic Deviations from Epitaxial Laws of Overgrowth
Autorzy:: Berger, H.
Möck, P.
Rosner, B.
Tematy:: 68.55.-a
68.65.+g; Pokaż więcej
Data publikacji:: 1993-08
Powiązania:: https://bibliotekanauki.pl/articles/1929560.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1993, 84, 2; 279-286
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: The effect of epitaxial misorientation on substrates having vicinal surfaces is studied using two simple geometrical models. The misorientations in two epitaxial systems, single layers and superlattices, can be partially explained by means of these models. Furthermore, the fundamentals of a new description tool for orientation relationships of epitaxial systems are outlined briefly, and two examples of application are given.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 4.

Tytuł:: Surface Geometric Structures of Cu Deposited upon α-Al$\text{}_{2}$O$\text{}_{3}$ (0001)
Autorzy:: Guo, Q.
Møller, P.
Gui, L.
Tematy:: 68.65.+g
68.55.Bd; Pokaż więcej
Data publikacji:: 1992-06
Powiązania:: https://bibliotekanauki.pl/articles/1920759.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1992, 81, 6; 647-651
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: Upon deposition of Cu on a 1 × 1 α-Al$\text{}_{2}$O$\text{}_{3}$ (0001) surface at room temperature the surface structure was found to change with increasing amounts of Cu deposited, from two-dimensional monolayer islands through three-dimensional nuclei until reaching a thin film. Subsequent surface heat-treatment to 650°C produced a stable Cu(111)-R30° superstructure as observed by LEED.
Dostawca treści:: Biblioteka Nauki

Artykuł

na półce

Skocz do pozycji: 5.

Tytuł:: Band-Offset and Electronic Properties of Type II PbTe/PbS Superlattices
Autorzy:: Sizov, F. F.
Gumenjuk-Sichevskaya, J. V.
Tetyorkin, V. V.
Zabudsky, V. V.
Tematy:: 68.65.+g; Pokaż więcej
Data publikacji:: 1995-02
Powiązania:: https://bibliotekanauki.pl/articles/1876007.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1995, 87, 2; 441-444
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: Semimetallic conductivity was observed in PbTe/PbS SL obtained by a "hot wall" technique on (001) KCl substrates with (001) PbTe buffer layers. From the analysis of R$\text{}_{H}$(H) and p$\text{}_{⊥}$(H) dependencies by the Monte-Carlo fitting procedure the band offset ΔE$\text{}_{v}$ = 0.32 ± 0.05 eV was obtained (T = 77 K) and it was proved that these SLs are type II "misaligned" structures. The calculations of the band structure of PbTe/PbS SLs showed that in such SLs a semimetal-semiconductor transition should occur for layer thicknesses of about 60÷70 Å.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 6.

Tytuł:: IV-VI Narrow-Gap Superlattices
Autorzy:: Sizov, F. F.
Tematy:: 68.65.+g; Pokaż więcej
Data publikacji:: 1991-01
Powiązania:: https://bibliotekanauki.pl/articles/1877496.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1991, 79, 1; 83-96
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: Electronic structure, optical and electrical properties of IV-VI superlattices and multiple quantum wells (MQW) are discussed and compared with corresponding properties of IV-VI bulk semiconductors. In particular, the types of superlattice structure and MQW formed from various constituents are discussed.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 7.

Tytuł:: Oscillations in Reflectivity of Samples with X-ray Waveguide Layers
Autorzy:: Pełka, J. B.
Lagomarsino, S.
Di Fonzo, S.
Jark, W.
Domagała, J.
Tematy:: 68.65.+g
78.20.Ci; Pokaż więcej
Data publikacji:: 1996-03
Powiązania:: https://bibliotekanauki.pl/articles/1945221.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1996, 89, 3; 323-328
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K$\text{}_{α}$ radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 8.

Tytuł:: Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect
Autorzy:: Pełka, J. B.
Lagomarsino, S.
Cedola, A.
Di Fonzo, S.
Jark, W.
Tematy:: 68.65.+g
78.20.-e; Pokaż więcej
Data publikacji:: 1997-05
Powiązania:: https://bibliotekanauki.pl/articles/1963396.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 851-857
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: In this work we present the new experimental results of total photoelectric yield as well as energy distribution of photoelectrons excited in a thin carbon film deposited on Ni mirror in the presence of resonance-enhanced X-ray propagation effect. The measurements were performed using conventional X-ray tube as a radiation source for the energy Cu K$\text{}_{α}$ (8047 keV). The spectra were recorded using a flow proportional electron counter with energy resolution of about 15%, and multichannel pulse height analyzer. A comparison with the reflectivity spectra recorded at the same time show an excellent correlation of both kinds of spectra, consistently with the theoretical prediction. A map of electron energy distribution is reported. Although the applied electron counter was of low energetic resolution the recorded spectra show characteristic regularities and indicate that the photoelectron yield excited in the presence of resonance-enhanced X-ray propagation effect can provide depth dependent information about impurity distribution and processes in thin layers.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 9.

Tytuł:: Strain Relaxation of ZnTe/CdTe and CdTe/ZnTe heterostructures: In Situ Study
Autorzy:: Riesz, F.
Kret, S.
Karczewski, G.
Wojtowicz, T.
Kossut, J.
Tematy:: 61.14.Hg
68.55.Bd
68.65.+g; Pokaż więcej
Data publikacji:: 1996-11
Powiązania:: https://bibliotekanauki.pl/articles/1952073.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1996, 90, 5; 911-914
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: The strain relaxation kinetics of ZnTe/CdTe and CdTe/ZnTe heterostructures grown on GaAs substrates by molecular beam epitaxy are studied by in situ reflection high-energy electron diffraction. The observed critical layer thickness is 5 monolayers for ZnTe/CdTe and less than 1 monolayer for CdTe/ZnTe. The relaxation is anisotropic. Dislocation core parameters and relaxation rate constants were determined using a kinetic model and assuming strain-dependent activation energy of dislocation movement.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 10.

Tytuł:: STM/AFM Observations of Co/Cu Magnetic Multilayers
Autorzy:: Aleszkiewicz, M.
Kalinowski, R.
Czajka, R.
Polewska, W.
Wawro, A.
Baczewski, L. T.
Raułuszkiewicz, J.
Tematy:: 61.16.Ch
68.65.+g
68.55.Jk; Pokaż więcej
Data publikacji:: 1997-02
Powiązania:: https://bibliotekanauki.pl/articles/1955472.pdf Link otwiera się w nowym oknie
Źródło:: Acta Physica Polonica A; 1997, 91, 2; 311-314
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Opis:: UHV deposited magnetic Co/Cu multilayers were investigated by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Surface of the sample i.e. upper covering layer in "plane" configuration and individual sublayers in "cross-section" configuration were investigated. A possibility of structure characterization of metallic multilayers by STM and AFM in the cross-section configuration is demonstrated.
Dostawca treści:: Biblioteka Nauki

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