Autor: Cyza, A. - Prolib Integro

Skocz do pozycji: 1.

Tytuł:: Perovskite La1-xSrxFeO3 Thin Films Deposited by Laser Ablation Process
Autorzy:: Cyza, A.
Cieniek, Ł.
Kopia, A.
Tematy:: Perovskite LaFeO3
thin films
gas sensors
PLD; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Powiązania:: https://bibliotekanauki.pl/articles/352657.pdf Link otwiera się w nowym oknie
Opis:: The aim of the research was to investigate the influence of strontium on the structure of thin films La1-xSrxFeO₃ (x = 0; 0,1; 0,2). The LaFeO₃ and Sr-doped LaFeO₃ films were produced by pulsed laser deposition (PLD) on Si (100) substrate using the Nd-YAG (λ = 266 nm) laser. SEM, AFM and XRD methods were used to characterize the structure and morphology of the thin films. X-Ray Diffraction analysis showed only the LaFeO₃ phase in the undoped thin film and the La0.9Sr0.1O3 and La0.8Sr0.2O₃ phases in thin films doped by Sr. The mean crystallite size, calculated by Williamson-Hall method, was smaller (of the order of 18 nm) in films doped by Sr. SEM analysis showed small droplets in thin films doped by Sr. Highly developed surface layer was observed using the AFM microscope for thin films doped by Sr.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Structural Characterization of $La_{1-x}Sr_xCoO_3$ Thin Films Deposited by Pulsed Electron Deposition Method
Autorzy:: Cieniek, Ł.
Kopia, A.
Cyza, A.
Kowalski, K.
Kusiński, J.
Tematy:: 81.15.-z
81.10.Bk
81.07.Bc
68.55.-a
68.55.J-
68.55.Nq
68.37.-d; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1398370.pdf Link otwiera się w nowym oknie
Opis:: The aim of the presented research was to investigate the influence of strontium dopant on the structure and composition of $La_{1-x}Sr_{x}CoO_3$ (x=0, 0.1, 0.2) perovskite thin films. Pure and Sr doped LaCoO₃ thin films were grown by pulsed electron deposition technique on crystalline epi-polished Si/MgO substrates. Numerous analytical techniques (scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy, and X-ray diffraction) were applied to characterize their phase/chemical composition, structure and surface morphology. X-ray diffraction analysis showed the presence of pure LaCoO₃ perovskite phase in the undoped thin film. For Sr doped thin films $La_{0.8}Sr_{0.2}CoO_3$ (x=0.2), $La_{0.9}Sr_{0.1}CoO_3$ (x=0.1) small contents of La₂ O₃ and LaSrCoO₄ phases were noticed. The crystallite sizes, calculated from the Williamson-Hall plots, were about 18 nm for all analyzed films. According to scanning electron microscopy/atomic force microscopy observations, obtained thin films were free from defects and cracks. Atomic force microscopy (tapping mode) analysis revealed the differences in the shape and quantity of surface crystallites for all thin films as a result of Sr doping and different deposition parameters. Atomic force microscopy technique also allowed measurement of roughness parameters for analyzed samples. X-ray photoelectron spectroscopy analyses of chemical states of elements of thin films showed that their chemical state was stable across the film thickness and even at the interface with the MgO substrate. X-ray photoelectron spectroscopy analysis also allowed to evaluate chemical states and atomic concentration of La, Co, and Sr elements within cross-sections of deposited thin films.
Dostawca treści:: Biblioteka Nauki

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