- Tytuł:
- Seebeck coefficient measurement by Kelvin-probe force microscopy
- Autorzy:
-
Ikeda, H.
Salleh, F.
Asai, K. - Tematy:
-
Seebeck coefficient
Kelvin-probe force microscopy
nanostructure - Pokaż więcej
- Wydawca:
- Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
- Powiązania:
- https://bibliotekanauki.pl/articles/384281.pdf  Link otwiera się w nowym oknie
- Opis:
- In order to measure the Seebeck coefficient of nanometer-scale thermoelectric materials, we propose a new technique in which the thermoelectric-motive force (TEMF) is evaluated by Kelvin-probe force microscopy (KFM). In this study, we measured the Seebeck coefficient of an n-type Si wafer. The surface-potential difference between the high- and low-temperature regions on the Si wafer increases with increasing temperature difference. This indicates that the TEMF can be measured by KFM. The Seebeck coefficient evaluated from the surface-potential difference is 0.71š0.08 mV/K, which is close to that obtained by the conventional method.
- Dostawca treści:
- Biblioteka Nauki
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