Autor: Luhin, V. - Prolib Integro

Skocz do pozycji: 1.

Tytuł:: Ekspresowa analiza jakości wybranych artykułów spożywczych z zastosowaniem półprzewodnikowych czujników gazu
Express analysis of food product quality using semiconductor gas sensors
Autorzy:: Zarapin, W.
Luhin, V.
Tematy:: express analysis
gas sensor
food products; Pokaż więcej
Wydawca:: Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Powiązania:: https://bibliotekanauki.pl/articles/154781.pdf Link otwiera się w nowym oknie
Opis:: Zbadano odpowiedzi półprzewodnikowych sensorów przy oddziaływaniu gazów N(CH3)3, H2S, C2H5OH, NH3. Określono wielkość odpowiedzi czujnika w zależności od koncentracji gazów w szerokim zakresie stężenia. Udowodniono skuteczność wykorzystania półprzewodnikowych sensorów gazowych do ekspresowej analizy jakości produktów spożywczych.
Responses of semiconductor sensors have been tested for action of N(CH3)3, H2S, C2H5OH, and NH3 gases within the temperature range from 100 oC to 350oC. For the tested gases the following temperature values corresponding to the sensor maximum sensitivity value have been selected: N(CH3)3 - 300 oC, H2S - 200 oC, C2H5OH - 275 oC, and NH3 - 275 oC.The sensor response magnitude has been determined depending on the gas concentration at the sensor maximum sensitivity temperature. Interactions have been tested in the equilibrium conditions. It has been found that values of equilibrium isotherm equation coefficients depend on the gas-sensor system temperature as well as on the chemical nature of a gas within a wide range of its concentration. The application of sensors to determine food product quality can be considered as an express quality analysis method. It makes possible to determine condition of fast-spoiling food products and the time left of their usability for consumption. The tested sensors are characterised by high sensitivity, low manufacturing costs and operating facility. Their additional advantage is that they can be used for the express quality analysis with no need to apply any complex and expensive measuring systems.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Composition of Surface Layers Prepared by Ion Beam Assisted Deposition of Catalytic Metals from Pulsed Arc-Discharge Plasma onto Carbon Paper Substrates
Autorzy:: Poplavsky, V.
Luhin, V.
Kołtunowicz, T.
Tematy:: 68.37.Hk
81.15.Jj
81.05.U-
82.80.Yc; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1033219.pdf Link otwiera się w nowym oknie
Opis:: The layers were prepared by ion beam assisted deposition of iridium and platinum onto AVCarb® Carbon Fiber Paper P50 electrocatalyst supports for the production of diffusion layers of the membrane-electrode assemblies of low temperature fuel cells with polymer electrolyte membrane. Formation of the layers in the ion beam assisted deposition mode, by means of the deposition of metal and mixing of precipitating layer with the substrate by the accelerated (U=10 kV) ions of the same metal, was performed. In this process neutral fraction of metal vapour and ionized plasma of vacuum pulsed electric arc discharge were used. The investigations of morphology and composition of layers were carried out by the scanning electron microscopy, energy dispersive X-ray microanalysis, wave dispersive X-ray fluorescence analysis, and the Rutherford backscattering spectrometry methods. It was established that the obtained catalytic layers contain atoms of the deposited metals and substrate material as well as impurity oxygen atoms. The surfaces contain also metal inclusions of several micrometer size which arise from the precipitation of deposited metal droplets from the arc discharge of an ion source. The content of iridium and platinum atoms in the layers is ≈2×10¹⁶ cm¯²; the concentration of the deposited metals equals about several atomic percent.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 3.

Tytuł:: Application of DC Magnetron Sputtering for Creation of Gas-Sensitive Indium Oxide Thin Films and Their Properties
Autorzy:: Luhin, V.
Zharsky, I.
Zhukowski, P.
Tematy:: 81.15.Cd
73.50.-h; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1400440.pdf Link otwiera się w nowym oknie
Opis:: In this paper the technology of gas sensitive semiconductor structures based on indium oxide thin films by DC magnetron sputtering of indium with the subsequent thermal oxidation is developed. Structure, surface morphology and chemical composition of the obtained films have been investigated by electron diffraction, scanning electron microscopy, Auger electron spectroscopy, and X-ray photoelectron spectroscopy. Conditions of $In_2O_3$ films formation with high selectivity and sensitivity to $NO_2$, and $NH_3$ are established.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 4.

Tytuł:: XRD Analysis of Synthetic Diamond Powders Irradiated with Electrons
Autorzy:: Shishonok, E.
Luhin, V.
Koltunowicz, T.
Tematy:: 61.05.-a
61.43.Gt
61.50.-f
61.80.Fe; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1402231.pdf Link otwiera się w nowym oknie
Opis:: Powders of synthetic diamond with low strength were sorted on sets with a different grain size. The synthetic diamond sets had various crushing strengths and morphology. They were irradiated with high energy electrons (6.5 MeV, D=2×10¹⁹ cm¯²) and analyzed using X-ray diffraction (Cu K_α) before and after irradiation. As established from nonlinearity of the a(Θ)=f{R(Θ)} dependences and observed extra splittings in X-ray diffraction patterns (in addition to α₁-α₂ doublets), crystal lattice of synthetic diamond from different sets was variously distorted. Irradiation led to decreasing distortions more significantly, the higher the initial strength of the set was. The made conclusions coincide well with our previous results on synthetic diamond powders which were irradiated under various softer conditions with direct measurements of synthetic diamond crushing strength without X-ray diffraction analysis. X-ray diffraction allows to presort synthetic diamond of critically low relative mechanical strength as well as evaluate resistance of diamond crystal lattice against heavy irradiation and other external impacts.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 5.

Tytuł:: The Kinetics of the Change of $SnO_{x}$ Thin Films Conductivity during the Gas-Adsorptive Interaction
Autorzy:: Zarapin, V.
Luhin, V.
Zukowski, P.
Koltunowicz, T.
Tematy:: 68.43.Mn
73.61.Jc; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1366165.pdf Link otwiera się w nowym oknie
Opis:: The subjects of investigation are thin semiconductor $SnO_{x}$ films received by thermal oxidation. The influence of gas environments on electrical conductivity of films were investigated by a static way by measurement of kinetic and equilibrium isotherm of adsorption of trimethylamine, alcohol, hydrogen sulfide and ammonia. The communication between a type isotherm of adsorption, chemical nature of gas and temperature is shown.
Dostawca treści:: Biblioteka Nauki

Artykuł

na półce

Skocz do pozycji: 6.

Tytuł:: Self-Ion Assisted Modification of Elastomer and Its Micro- and Macroscopic Properties
Autorzy:: Kasperovich, A.
Luhin, V.
Tashlykov, I.
Żukowski, P.
Tematy:: 81.05.Lg
66.30.Fq
81.15.-z
68.35.Np; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1199250.pdf Link otwiera się w nowym oknie
Opis:: The composition of Zr-based thin films on rubber was investigated by utilizing the Rutherford backscattering technique and RUMP code simulation. The level of adhesion between the coating fabricated on rubber by means of self-ion assisted deposition was measured using Pin Pull Test. The coating deposited on the rubber consists of Zr, O, C, H. The self-ion assisted deposition process may successfully control the level of adhesion of the coating to the rubber and causes strong modification of the macroscopic properties of the rubber surface.
Dostawca treści:: Biblioteka Nauki

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na półce

Skocz do pozycji: 7.

Tytuł:: Application of HPLC for the Analysis of Secoisolariciresinol Diglucoside in Flaxseeds
Autorzy:: Feskova, A.
Luhin, V.
Leontiev, V.
Sovastei, O.
Koltunowicz, T.
Tematy:: 82.80.Bg
82.80.Qx; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1400438.pdf Link otwiera się w nowym oknie
Opis:: High-pressure liquid chromatography - electrospray ionization-mass spectrometry coupled with the PDA detector was used for the analysis of secoisolariciresinol diglucoside in flaxseeds. The research was carried out using the spectrometer "Waters" on the BDS HYPERSIL column $C_{18}$ 250 × 4.6 mm, with the diode-array PDA 996 and the mass-detectors Micromass ZQ 2000 with the electrospray ionization. As a mobile phase acetonitrile and water with 0.1% formic acid were used. The content of secoisolariciresinol diglucoside in the flaxseeds of 12 cultivar was determined.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 8.

Tytuł:: Application of HPLC-MS with Electrospray Ionization for the Qualitative and Quantitative Analysis of Antibiotics in Pharmaceutical Formulation
Autorzy:: Likhtarovich, A.
Luhin, V.
Sovastei, O.
Zukowski, P.
Dado, M.
Tematy:: 32.10.Bi
33.15.Ta
82.80.-d; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1402227.pdf Link otwiera się w nowym oknie
Opis:: This study describes the application of electrospray ionization mass spectrometry in order to identify ten antibiotics (macrolides, penicillins, aminoglycosides). An optimum procedure was developed for determination of antibiotics of different grade. Positive ion spectra of most antibiotics are higher in intensity including an [M+H]⁺ ion and produce less fragmentation and are more informative compared to the negative ion spectra. The group of antibiotics exhibits the same characteristic fragmentation. The data base was developed for identification of antibiotics comparing of their molecular and fragment ions. The results of the study showed that the method with electrospray ionization is simple and quick which is useful in the routine determination of antibiotics and in their pharmaceutical dosage forms.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 9.

Tytuł:: Identification and Fragmentation of Cefalosporins, Lincosamides, Levofloxacin, Doxycycline, Vancomycin by ESI-MS
Autorzy:: Sapon, A.
Luhin, V.
Sovastei, O.
Spanik, P.
Bondariev, V.
Tematy:: 32.10.Bi
33.15.Ta
82.80.-d; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1030206.pdf Link otwiera się w nowym oknie
Opis:: The aim of the paper is the identification of the most frequently used antibiotics such as cefazolin, cefuroxime, cefotaxime, ceftriaxone, ceftazidime, lyncomycin, clindamycin, levofloxacin, doxycycline and vancomycin by electrospray ionization mass spectrometry interface in positive and negative modes. The fragmentation pathways of the group of antibiotics were colligated on the basis of the obtained ESI mass spectra. Generally, the positive ion spectra of antibiotics are higher in intensity including an [M+H]⁺ ion and producing less fragmentation as well as more informative compared to the negative ion spectra. Only ESI of levofloxacin in positive and negative modes with the chosen tune parameters leads to degradation of molecular ion, so the parent ion does not appear in the mass spectra. The group of antibiotics (cephalosporins and lincosamides) shows the same characteristic fragmentation. These setup parameters were successfully applied for the routine determination of antibiotics in their pharmaceutical dosage forms and other objects. Data base was developed for identification of antibiotics by comparison of their molecular and fragment ions.
Dostawca treści:: Biblioteka Nauki

Artykuł

na półce

Skocz do pozycji: 10.

Tytuł:: Composition and Microstructure of Surface Layers Produced by Ion Beam Assisted Deposition of Metals from a Pulsed Arc-Discharge Plasma onto Aluminum Substrates
Autorzy:: Poplavsky, V.
Komarov, F.
Luhin, V.
Pil'ko, V.
Partyka, J.
Tematy:: 68.37.Hk
68.55.Nq; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1402241.pdf Link otwiera się w nowym oknie
Opis:: Ion beam assisted deposition of alloying metals (Zn, Cd, Zr, Cr) onto pure aluminum and aluminum alloy substrates from the plasma of a pulsed arc discharge for the purpose of materials corrosion stability was carried out. The Rutherford backscattering spectrometry, electron backscatter diffraction, scanning electron microscopy, and electron probe microanalysis methods were applied to investigate composition and microstructure of the prepared layers. It was found that the obtained layers are characterized by amorphous atomic structure and contain the atoms of deposited metal, substrate material components, as well as impurities of oxygen and carbon; their thickness was measured to be ≈ 30-100 nm.
Dostawca treści:: Biblioteka Nauki

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