Autor: Mosset, A. - Prolib Integro

Skocz do pozycji: 1.

Tytuł:: Laboratory Dispersive EXAFS Spectrometer
Autorzy:: Mosset, A.
Lecante, P.
Baules, P.
Jaud, J.
Galy, J.
Burian, A.
Tematy:: 07.85.Nc
61.10.Ht
61.43.-j; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1963392.pdf Link otwiera się w nowym oknie
Opis:: We report on a laboratory EXAFS spectrometer optimized for transmission dispersive mode. Absorption edges ranging from 6 to 20keV can be studied. Factors determining energy range and resolution are detailed. A new asymmetric geometry which allows to use all the lattice planes of the dispersing crystal is described and the choice of the best plane analysed. EXAFS spectra of Cu metal and Cu acetate, obtained on this laboratory facility, are compared to the corresponding spectra recorded on the French synchrotron facility (LURE).
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As
Autorzy:: Burian, A.
Lecante, P.
Mosset, A.
Galy, J.
Tonnerre, J. M.
Raoux, D.
Tematy:: 78.70.Dm
61.10.-i; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/1931688.pdf Link otwiera się w nowym oknie
Opis:: The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films
Autorzy:: Burian, A.
Jabłońska, A.
Burian, A. M.
Le Bolloc'h, D.
Metzger, H.
Proux, O.
Hazemann, J. L.
Mosset, A.
Raoux, D.
Tematy:: 61.10.-i
61.43.Dq; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Powiązania:: https://bibliotekanauki.pl/articles/2030649.pdf Link otwiera się w nowym oknie
Opis:: The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In$\text{}_{50}$Se$\text{}_{50}$ and Se-In and Se-Se correlations for In$\text{}_{40}$Se$\text{}_{60}$ and In$\text{}_{34}$Se$\text{}_{66}$ within the first coordination sphere.
Dostawca treści:: Biblioteka Nauki

Artykuł

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