- Tytuł:
- Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors
- Autorzy:
-
Torrisi, A.
Wachulak, P.
Torrisi, L.
Bartnik, A.
Węgrzyński, Ł.
Fiedorowicz, H. - Tematy:
-
gas-puff target
plasma diagnostic technique
SiC detector
‘water-window’
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- Wydawca:
- Instytut Chemii i Techniki Jądrowej
- Powiązania:
- https://bibliotekanauki.pl/articles/147432.pdf  Link otwiera się w nowym oknie
- Opis:
- An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ = 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.
- Dostawca treści:
- Biblioteka Nauki
Artykuł