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Wyszukujesz frazę "distributed Bragg reflector" wg kryterium: Temat


Wyświetlanie 1-2 z 2
Tytuł:
Development of the hybrid distributed Bragg reflectors for mid-infrared applications
Autorzy:
Mikulicz, Monika
Badura, Mikołaj
Rygała, Michał
Smołka, Tristan
Macherzyński, Wojciech
Łozińska, Adriana
Motyka, Marcin
Tematy:
distributed Bragg reflector
mid-infrared
meatal coating
InP
GaAs
FTIR
Pokaż więcej
Wydawca:
Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
Powiązania:
https://bibliotekanauki.pl/articles/59112907.pdf  Link otwiera się w nowym oknie
Opis:
In this study, an analysis of the optical performance of two types of distributed Bragg reflector structures based on GaAs and InP material systems was carried out. The structures were designed for maximum performance at 4 μm with their reflectivity achieving between 80 and 90% with eight pairs of constituent layers. To further enhance the performance of these structures, additional Au layers were added at the bottom of the structure with Ti precoating applied to improve the adhesivity of the Au to the semiconductor substrate. The optimal range of Ti layer thickness resulting in the improvement of the maximum reflectivity was determined to be in between 5 and 15 nm.
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Influence of Chirped DBR Reflector on the Absorption Efficiency of Multi-nanolayer Photovoltaic Structures: Wavelength-scale Analysis by the Method of Single Expression
Autorzy:
Baghdasaryan, H.
Knyazyan, T.
Hovhannisyan, T.
Mardoyan, G.
Marciniak, M.
Benson, T.
Tematy:
antireflection coating
chirped distributed Bragg reflector
electromagnetic modeling
method of single expression
multi-nanolayer photovoltaic structure
photovoltaics
Pokaż więcej
Wydawca:
Instytut Łączności - Państwowy Instytut Badawczy
Powiązania:
https://bibliotekanauki.pl/articles/958075.pdf  Link otwiera się w nowym oknie
Opis:
An electromagnetic wavelength-scale analysis of the optical characteristics of multi-nanolayer photovoltaic (PV) structures: without an antireflection coating, with an antireflection coating on the top of the structure, and with both the antireflection coating on the top and a broadband non-periodic (chirped) distributed Bragg reflector (DBR) on the bottom of the structure is performed. All the PV structures studied are based on a Si p-i-n type absorber supported by a metallic layer (Cu) and SiO2 substrate. The top-to-bottom electromagnetic analysis is performed numerically by the method of single expression (MSE). Absorbing and reflecting characteristics of the multi-nanolayer PV structures are obtained. The influence of the thicknesses and permittivities of the layers of the PV structures on the absorbing characteristics of the structures is analyzed to reveal favourable configurations for enhancement of their absorption efficiency. The localizations of the electric component of the optical field and the power flow distribution within all the PV structures considered are obtained to confirm an enhancement of the absorption efficiency in the favorable configuration. The results of the electromagnetic wavelength-scale analysis undertaken will have scientific and practical importance for optimizing the operation of thin-filmmulti-nanolayer PV structures incorporating a chirped DBR reflector with regards to enhancing their efficiency.
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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