Temat: scanning probe - Prolib Integro

Skocz do pozycji: 1.

Tytuł:: ARMScope – the versatile platform for scanning probe microscopy systems
Autorzy:: Świadkowski, Bartosz
Piasecki, Tomasz
Rudek, Maciej
Świątkowski, Michał
Gajewski, Krzysztof
Majstrzyk, Wojciech
Babij, Michał
Dzierka, Andrzej
Gotszalk, Teodor
Tematy:: Scanning probe microscopy
AFM
Kelvin Probe force microscopy
scanning tunnelling microscopy; Pokaż więcej
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Powiązania:: https://bibliotekanauki.pl/articles/221551.pdf Link otwiera się w nowym oknie
Opis:: Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator. Although the ease of use opened a possibility for measurements without high labour requirement, a quantitative analysis is still a limitation in Scanning Probe Microscopes available on the market. Based on experience of Nano-metrology Group, SPM still can be considered as a tool for quantitative examination of thermal, electrical and mechanical surface parameters. In this work we present an ARMScope platform as a versatile SPM controller that is proved to be useful in a variety of applications: from atomic-resolution STM (Scanning Tunnelling Microscopy) to Multi-resonance KPFM (Kelvin Probe force microscopy) to commercial SEMs (Scanning electron microscopes).
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Probe radius correction methods - review and comparison of existing methods
Autorzy:: Rak, A.
Woźniak, A.
Tematy:: coordinate measuring machine (CMM)
scanning probe
probe tip radius correction; Pokaż więcej
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Powiązania:: https://bibliotekanauki.pl/articles/385250.pdf Link otwiera się w nowym oknie
Opis:: Scanning technology has been becoming more common then ever. Scanning offers new and effective possibilities of measurement. Nowadays planning, production and assembling without high accurate metrology is impossible. Measurement of small, curved elements became much easier with great development of mechanical components of measure machines, such as: guideways, transducers, bearings, servomechanisms. All this improvement made possible to collect with good accuracy points in high density. Algorithms, and computer software were greatly improved as well. Especially, many efforts were put on probe radius correction algorithms development. In this paper a review and a comparison of probe radius correction methods are shown.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 3.

Tytuł:: Controlled reorientation of CuPc molecules in ordered structures assembled on the TiO(2)(011)-(2x1) surface
Autorzy:: Prauzner-Bechcicki, Jakub
Tekiel, Antoni
Godlewski, Szymon
Szymoński, Marek
Budzioch, Janusz
Opis:: Molecular reorientation: Copper (II) phthalocyanines are investigated on the rutile TiO2(011)-(2×1) surface. At first, a quasi-ordered wetting monolayer is formed, after which well-ordered islands composed of flat-lying molecules appear (picture, left). Post-deposition thermal annealing at 200 °C leads to a complete reorientation of the second layer so that the molecules adopt an upright configuration (picture, right).
Dostawca treści:: Repozytorium Uniwersytetu Jagiellońskiego

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Skocz do pozycji: 4.

Tytuł:: Adsorption of large organic molecules on clean and hydroxylated rutile TiO2(110) surfaces
Autorzy:: Prauzner-Bechcicki, Jakub
Tekiel, Antoni
Gourdon, Andre
Godlewski, Szymon
Szymoński, Marek
Budzioch, Janusz
Opis:: Behavior of large organic molecules equipped with spacer groups (Violet Landers, VL) on the TiO(2)(110)-(1x1) surfaces is investigated by means of high-resolution scanning tunneling microscopy (STM). Two distinct adsorption geometries are observed. We demonstrate that the molecule adsorption morphology can be alternated by well-controlled STM tip-induced manipulation. It is used to probe the mobility of molecules and reveals locking in one of the analyzed adsorption sites, thus allow to enhance or reduce the mobility along the [001] direction. Field induced hydrogen desorption is used to perform lateral STM manipulation on a hydroxyl-free surface, which provides insight into the influence of surface hydroxyl groups on the molecule behavior. The ability to image with submolecular resolution both the central board and the spacer groups of the VL molecule is demonstrated.
Dostawca treści:: Repozytorium Uniwersytetu Jagiellońskiego

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Skocz do pozycji: 5.

Tytuł:: Polymerization of polyanthrylene on a titanium dioxide (011)-(2×1) surface
Autorzy:: Kolmer, Marek
Prauzner-Bechcicki, Jakub
Sojka, Zbigniew
Szymoński, Marek
Such, Bartosz
Zasada, Filip
Zebari, Amir A. Ahmad
Godlewski, Szymon
Piskorz, Witold
Opis:: On-surface polymerization is feasible on semiconducting surfaces. Thermally triggered covalent coupling of 10,10′-dibromo-9,9′-bianthryl molecules on the TiO2(011)-(2×1) surface is demonstrated. The result paves the way for application of the thermally driven on-surface polymerization on semiconducting surfaces and indicates that methods based on such a reaction are more universal than previously thought.
Dostawca treści:: Repozytorium Uniwersytetu Jagiellońskiego

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Skocz do pozycji: 6.

Tytuł:: [11]Anthrahelicene on InSb(001) c(8×2): a low-temperature scanning probe microscopy study
Autorzy:: Goryl, Grzegorz
Budzioch, Janusz
Walczak, Łukasz
Godlewski, Szymon
Stará, Irena, G.
Ample, Francisco
Szymoński, Marek
Sehnal, Petr
Joachim, Christian
Starý, Ivo
Prauzner-Bechcicki, Jakub
Opis:: The adsorption of individual [11]anthrahelicene molecules and their self-assembly into monolayer islands on an InSb(001) c(8×2) reconstructed surface is studied with low-temperature scanning probe microscopy. A racemic mixture is deposited on atomically flat terraces of InSb at room temperature. At lower coverage, the molecules tend to decorate atomic step edges of the substrate. At higher coverage, [11]anthrahelicene molecules form 2D islands. A quasi-hexagonal ordering of molecules within the layer is identified. Furthermore, it is shown that molecules adsorb with the helical axis almost perpendicular to the substrate. Interference between tunneling through the molecular layer and directly through space is reported. Finally, experimental results are compared to those of theoretical calculations.
Dostawca treści:: Repozytorium Uniwersytetu Jagiellońskiego

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Skocz do pozycji: 7.

Tytuł:: Model kinetyczny przetwornika pasywnych głowic skaningowych CMM
Kinetic model of CMM scanning passive probe transducer
Autorzy:: Krajewski, G.
Woźniak, A.
Tematy:: głowica skanująca
współrzędnościowa maszyna pomiarowa
CMM
scanning probe
coordinate measuring machine; Pokaż więcej
Wydawca:: Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Powiązania:: https://bibliotekanauki.pl/articles/155447.pdf Link otwiera się w nowym oknie
Opis:: W artykule przedstawiono analizę teoretyczną budowy przetwornika głowic skaningowych pasywnych stosowanych do pomiarów w technice współrzędnościowej. W efekcie podjętych prac autorzy otrzymali wstępny model dynamiczny pracy głowic, który może posłużć do kompensacji ich błędów powstałych na skutek zwiększenia prędkości pomiarowej.
Scanning probes, also known as measuring probes, are one of the most often used equipment of coordinate measuring machines (CMM) owing to ability of collecting large number of measuring points as well as taking fast measurements. High speed of measurements and high accuracy of the measuring system are two critical parameters deciding about the machine effectiveness. Dynamics is the most significant factor limiting the measurement accuracy. In most investigations of scanning CMM there is not separated the probing system performance from other sources of the machine errors, so the true error influenced by the probing system is not profoundly determined. This paper presents the scanning probe model regardless of the machine links. The worked out model allows for better understanding of the probing process with higher speed and optimising the measuring process. The future works will aim at proposing optimisation algorithms and applying them to the probing system as well as obtaining improvement in the accuracy.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 8.

Tytuł:: Problemy związane z korekcją promienia końcówki pomiarowej podczas skaningowych pomiarów współrzędnościowych
Difficulties with the corrected measured point determination in coordinate metrology
Autorzy:: Woźniak, A.
Mayer, M.
Cote, M.
Tematy:: Współrzędnościowa Maszyna Pomiarowa
WMP
sonda głowica skaningowa
korekcja promienia końcówki
Coordinate Measuring Machine
CMM
scanning probe
probe radius compensation; Pokaż więcej
Wydawca:: Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Powiązania:: https://bibliotekanauki.pl/articles/153572.pdf Link otwiera się w nowym oknie
Opis:: W artykule przedstawiono analizy teoretyczne i badania doświadczalne potwierdzające, że korekcja promienia końcówki pomiarowej może być istotnym źródłem błędów podczas saningowych pomiarów przeprowadzanych na maszynach współrzędnościowych. Przedstawiono wyniki pomiarów przykładowego elementu na maszynie Mitutoyo LEGEX 910 CMM wyposażonej w sondę skaningową MPP-300, ze wskazaniem mechanizmów złej korekcji promienia końcówki pomiarowej.
Paper discusses an understanding for the compensation of the probe ball radius in a scanning process carried out by coordinate measuring machines (CMM). According to some initial trials of scanning measurement using the stylus tip radius correction built-in the CMM software, it was found, as will be shown in the paper, that the indigenous CMM software do not compensate the stylus tip radius well. As a result, the information about the real shape of the measured reatures can be distored. The difficulties with the corrected measured point determination will be demonstrate no the basis of tests were carried out on a Mitutoyo LEGEX 910 CMM equipped with a MPP-300 scanning probe.
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 9.

Tytuł:: Scanning probe microscopy studies on the adsorption of selected molecular dyes on titania
Autorzy:: Such, Bartosz
Hinaut, Antoine
Jöhr, Res
Prauzner-Bechcicki, Jakub
Glatzel, Thilo
Olszowski, Piotr
Meyer, Ernst
Szymoński, Marek
Zając, Łukasz
Opis:: Titanium dioxide, or titania, sensitized with organic dyes is a very attractive platform for photovoltaic applications. In this context, the knowledge of properties of the titania–sensitizer junction is essential for designing efficient devices. Consequently, studies on the adsorption of organic dyes on titania surfaces and on the influence of the adsorption geometry on the energy level alignment between the substrate and an organic adsorbate are necessary. The method of choice for investigating the local environment of a single dye molecule is high-resolution scanning probe microscopy. Microscopic results combined with the outcome of common spectroscopic methods provide a better understanding of the mechanism taking place at the titania–sensitizer interface. In the following paper, we review the recent scanning probe microscopic research of a certain group of molecular assemblies on rutile titania surfaces as it pertains to dye-sensitized solar cell applications. We focus on experiments on adsorption of three types of prototypical dye molecules, i.e., perylene-3,4,9,10-tetracarboxylic dianhydride (PTCDA), phtalocyanines and porphyrins. Two interesting heteromolecular systems comprising molecules that are aligned with the given review are discussed as well.
Dostawca treści:: Repozytorium Uniwersytetu Jagiellońskiego

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Skocz do pozycji: 10.

Tytuł:: Analysis of the electrolytically polished skeletal dentures surfaces using various nano- and microscopic technologies
Autorzy:: Dąbrowa, Tomasz
Majstrzyk, Wojciech
Tamulewicz, Magdalena
Piasecki, Tomasz
Kunicki, Piotr
Więckiewicz, Włodzimierz
Gotszalk, Teodor
Tematy:: chropowatość powierzchni
skaningowa mikroskopia elektronowa
proteza ruchoma
mikroskopia skaningowa
surface roughness
scanning electron microscopy
removable partial denture
scanning probe microscopy
optical profilometry; Pokaż więcej
Wydawca:: Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Powiązania:: https://bibliotekanauki.pl/articles/306706.pdf Link otwiera się w nowym oknie
Opis:: The surface roughness of the dental restorations is significant to the denture plaque adhesion. Methods: In this work, we present the complex analysis of the electropolished CoCrW alloy remanium® star (Dentaurum, Germany) samples with laserengraved fiducial marks performed using complementary set of micro- and nanoscopic techniques: optical profilometry (OP), atomic force microscopy (AFM), scanning electron microscopy (SEM) and focused ion beam (FIB) milling. Results: Both mean and RMS roughness of the samples were reduced by electopolishing process, however, the results obtained using OP and AFM exhibited some discrepancies. This was caused by the relatively high local protruding defects developed on the processed surface. The cross-sections of the protrusions were made to analyze the cause of their formation as the EDS elemental content maps revealed that their composition was uniform. We also analyzed the local roughness in the smaller areas free from the defects. Conclusions: In that case, both OP and AFM techniques delivered the same results. Analysis of results showed that various methods used for the surface roughness evaluation have to be used simultaneously to obtain complete and true analysis of the technological CoCrW samples.
Dostawca treści:: Biblioteka Nauki

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